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research faciliteis





THE DIELECTRIC SPECTROSCOPY LABORATORY

It is a general purpose facility which is focused and optimized for the study of dynamical processes in polymers,
in particular and other soft-matter in general.
The main features are: i) by combining different spectrometers it covers a huge dynamical range of about 16 orders of
magnitude in the time/frequency scale and ii) a wide range of sample environments can be used.

THERMAL ANALYSIS TECHNIQUES        

- DIFFERENTIAL SCANNING CALORIMETRY (DSC)
Q2000 TMDSC, TA Instruments(100 - 700 K) (some examples)

- FLASH DIFFERENTIAL SCANNING CALORIMETRY (Flasch DSC)
Flash DSC1, Mettler Toledo (180 - 700 K) (heating rates 30 K/min - 2400000 K/min)

- PVT MEASURING SYSTEM
pvT100, Thermo Haake (200 - 550 K, 200 - 2500 Bar)

- THERMOGRAVIMETRIC ANALYSIS (TGA)
Q500, TA Instruments (290 - 1300 K)

- RESEARCH DILATOMETER (DIL)
Zero Friction L75V, Linseis (100 - 800 K) dual push rod version. manuals(onsite only)

MECHANICAL ANALYSIS TECHNIQUES

- RHEOMETRY
ARES-LS2, TA Instruments (130 - 800 K) (1mHz - 50 Hz)
Simultaneous electric impedance analysis (20Hz - 1MHz)
HR20 Discovery Hybrid Rheometer, TA Instruments (120 - 870 K) (1mHz - 50 Hz)
        -       Miniature Material Tester
Minimat 200 Rheometrics Scientific (200 - 500 K)

- EMS-Viscosimeter
EMS-1000 Kyoto Electronics Manufacturing (0.1-1e5 mPa s) (300 - 473 K)

MOLECULAR SPECTROSCOPIES

- INFRARED SPECTROMETER FT-IR
JASCO 6300 (130 - 400 K) manuals(onsite only)

- RAMAN SPECTROMETER FT-RAMAN
JASCO RFT-6000 (130 - 400 K) manuals(onsite only)

- TERAHERTZ SPECTROMETER
TPS SPECTRA 3000, TeraView

STRUCTURAL CHARACTERIZATION TECHNIQUES        

- ATOMIC FORCE MICROSCOPE
MultiMode 8, Bruker (250 - 470 K), working modes: AFM, LFM, EFM, MFM, TUNA

- OPTICAL/CONFOCAL MICROSCOPE
Leica TCS SPE DM5500 (120 - 520 K) manuals(onsite only)

- DESKTOP SCANNING ELECTRON MMICROSCOPE
Hitachi TM-3000 (250 - 320 K) manuals(onsite only)

- SMALL ANGLE X-RAY SCATTERING (SAXS)
Rigaku PSAXS-L (120 - 520 K) with simultaneous WASX measurements

- WIDE ANGLE X-RAY DIFFRACTOMETER
Bruker AXS D8 ADVANCE (120 - 520 K) pdfnotes(onsite only)

- DYNAMIC AND STATIC LIGHT SCATTERING (LS)
3D LS Spectrometer (280 - 360 K) (angular range: 12 - 153 deg)

OTHER COMPLEMENTARY TECHNIQUES        

- REFRACTOMETER
Metricon 2010/M Prism Coupler

- HOT-PLATE HYDRAULIC PRESS
Labopress 200-T VOGT (290 - 550 K)

- CLIMATIC CHAMBER
VOTSCH VCL 0003 (290 - 380 K, rh>5%)

- VACUUM OVENS
HERAEUS VT SERIES (290 - 420 K, 0.1 mBar)

- FREEZE-DRYING SYSTEM
TELSTAR, CRYODOS -80

- SPUTTERING SYSTEM
HERAEUS VT 6025 (290 - 420 K, 0.1 mBar)

CHEMISTRY LABORATORY 
        -       ABSOLUTE MOLECULAR MASS DISTRIBUTION DETERMINATION 
Agilent 1200 GPC-SEC Analysis System +
Wyatt Ligth-scattering miniDAWN TREOS +
Differential viscosimeter ViscoStar II +
Refractive Index Detector Optilab rEX

' MOLECULAR MASS DISTRIBUTION DETERMINATION
Nexera 40 GPC system Shimadzu with Refractive Index Detector

- RECYCLING PREPARATIVE GPC
LABOACE LC-5060 (Japan Analytical Industry)
Equipped with UV & RI DETECTORS
JAIGEL 2.5 HR, 3 HR AND 4 HR columns and column oven.

- NANOPARTICLE SIZE AND Z-POTENCIAL DETERMINATION
Malvern Zetasizer Nano

- VISCOSIMETER
Malvern SV-10 Vibro Viscometer

- SURFACE TENSION DETERMINATION
Contact Angle meter OCA 15 EC DataPhysics Instruments GmbH

- LIQUID/SOLUTION DENSITY METER
ANTON PAAR model: DMA 4500 M
        -       UV-VIS SPECTROMETER 
Agilent 8453A with Peltier thermostatted cell holder, T-controller 89090A

- CLOSE VESSEL MICROWAVE ASSSISTED REACTOR
CEM Discover SP System (200- 550 K, 0-27 bar)

COMPUTING FACILITIES FOR MOLECULAR DYNAMIC SIMULATIONS
        - INSIGHT II (4.0.0.+ version) & Materials Studio Package & Discovery Studio Package from Accelrys. (some results)
- HP Server, 16 CPUs, 2 Intel Xeon QC + 2 G5 Intel QC processors (2.13 GHz), 32Gb RAM
- BULL cluster. 128 cores Intel Xeon 2.8 GHz, 128 Gb RAM, scratch disk 15 Tb, Red Hat Enterprise Server (some results)

TECHNIQUES AVAILABLE AS GENERAL RESEARCH SERVICES AT THE UPV/EHU 

- NUCLEAR MAGNETIC RESONANCE

- ELECTRON MICROSCOPY

- OTHER CHARACTERIZATION TECHNIQUES


TECHNIQUES FREQUENTLY USED IN LARGE SCALE FACILITIES 

- INELASTIC AND QUASIELASTIC NEUTRON SCATTERING
ILL, JCNS, ISIS, PSI, ...

- SYNCHROTRON RADITATION X-RAY SCATTERING

ESRF, ...



Contact |Where we are | Group photo | Last updated May 2022