THE DIELECTRIC SPECTROSCOPY LABORATORY
It is a general purpose facility which is focused and optimized for the study of dynamical processes in polymers,
in particular and other soft-matter in general.
The main features are: i) by combining different spectrometers it covers a huge dynamical range of about 16 orders of
magnitude in the time/frequency scale and ii) a wide range of sample environments can be used.
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THERMAL ANALYSIS TECHNIQUES
- DIFFERENTIAL SCANNING CALORIMETRY (DSC)
Q2000 TMDSC, TA Instruments(100 - 700 K) (some examples)
- FLASH DIFFERENTIAL SCANNING CALORIMETRY (Flasch DSC)
Flash DSC1, Mettler Toledo (180 - 700 K) (heating rates 30 K/min - 2400000 K/min)
- THERMOGRAVIMETRIC ANALYSIS (TGA)
Discovery 550 Advanced, TA Instruments (290 - 1300 K)
- RESEARCH DILATOMETER (DIL)
Zero Friction L75V, Linseis (100 - 800 K) dual push rod version. manuals(onsite only)
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MECHANICAL ANALYSIS TECHNIQUES
- RHEOMETRY
ARES-LS2, TA Instruments (130 - 800 K) (1mHz - 50 Hz)
Simultaneous electric impedance analysis (20Hz - 1MHz)
HR20 Discovery Hybrid Rheometer, TA Instruments (120 - 870 K) (1mHz - 50 Hz)
- Miniature Material Tester
Minimat 200 Rheometrics Scientific (200 - 500 K)
- EMS-Viscosimeter
EMS-1000 Kyoto Electronics Manufacturing (0.1-1e5 mPa s) (300 - 473 K)
- Automatic Viscosimeter with thermostat CT 72/2
ViscoClock plus + SI ANALYTICS
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MOLECULAR SPECTROSCOPIES
- INFRARED SPECTROMETER FT-IR
JASCO 6300 (130 - 400 K) manuals(onsite only)
- RAMAN SPECTROMETER FT-RAMAN
JASCO RFT-6000 manuals(onsite only)
- TERAHERTZ SPECTROMETER
TPS SPECTRA 3000, TeraView
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STRUCTURAL CHARACTERIZATION TECHNIQUES
- ATOMIC FORCE MICROSCOPE
MultiMode 8, Bruker (250 - 470 K), working modes: AFM, LFM, EFM, MFM, TUNA
- OPTICAL/CONFOCAL MICROSCOPE
Leica TCS SPE DM5500 (120 - 520 K) manuals(onsite only)
- DESKTOP SCANNING ELECTRON MMICROSCOPE
Hitachi TM-3000 (250 - 320 K) manuals(onsite only)
- SMALL ANGLE X-RAY SCATTERING (SAXS)
Rigaku PSAXS-L (120 - 520 K) with simultaneous WASX measurements
- WIDE ANGLE X-RAY DIFFRACTOMETER
Bruker AXS D8 ADVANCE (120 - 520 K) pdfnotes(onsite only)
- DYNAMIC AND STATIC LIGHT SCATTERING (LS)
3D LS Spectrometer (280 - 360 K) (angular range: 12 - 153 deg)
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OTHER COMPLEMENTARY TECHNIQUES
- REFRACTOMETER
Metricon 2010/M Prism Coupler
- CLIMATIC CHAMBER
VOTSCH VCL 0003 (290 - 380 K, rh>5%)
- VACUUM OVENS
HERAEUS VT SERIES (290 - 420 K, 0.1 mBar)
- FREEZE-DRYING SYSTEM
COOLVACUUM, LYOMICROM -80
- SPUTTERING SYSTEM
HERAEUS VT 6025
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CHEMISTRY LABORATORY
- ABSOLUTE MOLECULAR MASS DISTRIBUTION DETERMINATION
Agilent 1200 GPC-SEC Analysis System +
Wyatt Ligth-scattering miniDAWN TREOS +
Differential viscosimeter ViscoStar II +
Refractive Index Detector Optilab rEX
- ABSOLUTE MOLECULAR MASS DISTRIBUTION DETERMINATION
Nexera 40 GPC system Shimadzu with Refractive Index Detector +
Shimadzu UV- Detector +
Wyatt MultiAngle-Ligth-Scattering miniDAWN NEON
- RECYCLING PREPARATIVE GPC
LABOACE LC-5060 (Japan Analytical Industry)
Equipped with UV & RI DETECTORS
JAIGEL 2.5 HR, 3 HR AND 4 HR columns and column oven.
- NANOPARTICLE SIZE AND Z-POTENCIAL DETERMINATION
Malvern Zetasizer Nano
- VISCOSIMETER
Malvern SV-10 Vibro Viscometer
- SURFACE TENSION DETERMINATION
Contact Angle meter OCA 15 EC DataPhysics Instruments GmbH
- LIQUID/SOLUTION DENSITY METER
ANTON PAAR model: DMA 4500 M
- UV-VIS SPECTROMETER
Agilent 8453A with Peltier thermostatted cell holder, T-controller 89090A
- CLOSE VESSEL MICROWAVE ASSSISTED REACTOR
CEM Discover SP System (200- 550 K, 0-27 bar)
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COMPUTING FACILITIES FOR MOLECULAR DYNAMIC SIMULATIONS
- INSIGHT II (4.0.0.+ version) & Materials Studio Package & Discovery Studio Package from Accelrys. (some results)
- HP Server, 16 CPUs, 2 Intel Xeon QC + 2 G5 Intel QC processors (2.13 GHz), 32Gb RAM
- BULL cluster. 128 cores Intel Xeon 2.8 GHz, 128 Gb RAM, scratch disk 15 Tb, Red Hat Enterprise Server (some results)
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TECHNIQUES AVAILABLE AS GENERAL RESEARCH SERVICES AT THE UPV/EHU
- NUCLEAR MAGNETIC RESONANCE
- ELECTRON MICROSCOPY
- OTHER CHARACTERIZATION TECHNIQUES
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TECHNIQUES FREQUENTLY USED IN LARGE SCALE FACILITIES
- INELASTIC AND QUASIELASTIC NEUTRON SCATTERING
ILL, JCNS, ISIS, PSI, ...
- SYNCHROTRON RADITATION X-RAY SCATTERING
ESRF, ...
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