THE DIELECTRIC SPECTROSCOPY LABORATORY

It is a general purpose facility which is focused and optimized for the study of dynamical processes in polymers, 
in particular and other soft-matter in general. 
The main features are: i) by combining different spectrometers it covers a huge dynamical range of about 16 orders of 
magnitude in the time/frequency scale and ii) a wide range of sample environments can be used.

THERMAL ANALYSIS TECHNIQUES        

        -       DIFFERENTIAL SCANNING CALORIMETRY (DSC)
                Q2000 TMDSC, TA Instruments(100 - 700 K) (some examples)

        -       FLASH DIFFERENTIAL SCANNING CALORIMETRY (Flasch DSC)
                Flash DSC1, Mettler Toledo (180 - 700 K) (heating rates 30 K/min - 2400000 K/min) 

        -       THERMOGRAVIMETRIC ANALYSIS (TGA)
                Discovery 550 Advanced, TA Instruments (290 - 1300 K)

        -       RESEARCH DILATOMETER (DIL)
                Zero Friction L75V, Linseis (100 - 800 K) dual push rod version. manuals(onsite only) 

MECHANICAL ANALYSIS TECHNIQUES

        -       RHEOMETRY
                ARES-LS2, TA Instruments (130 - 800 K) (1mHz - 50 Hz)
		Simultaneous electric impedance analysis (20Hz - 1MHz) 
                HR20 Discovery Hybrid Rheometer, TA Instruments (120 - 870 K) (1mHz - 50 Hz) 

        -       Miniature Material Tester
                Minimat 200 Rheometrics Scientific (200 - 500 K)

        -       EMS-Viscosimeter
                EMS-1000 Kyoto Electronics Manufacturing (0.1-1e5 mPa s) (300 - 473 K)

        -       Automatic Viscosimeter with thermostat CT 72/2 
                ViscoClock plus + SI ANALYTICS  

MOLECULAR SPECTROSCOPIES

        -       INFRARED SPECTROMETER FT-IR
                JASCO 6300 (130 - 400 K) manuals(onsite only) 

        -       RAMAN SPECTROMETER FT-RAMAN
                JASCO RFT-6000  manuals(onsite only) 

        -       TERAHERTZ SPECTROMETER 
                TPS SPECTRA 3000, TeraView 

STRUCTURAL CHARACTERIZATION TECHNIQUES        

        -       ATOMIC FORCE MICROSCOPE
                MultiMode 8, Bruker (250 - 470 K), working modes: AFM, LFM, EFM, MFM, TUNA 

        -       OPTICAL/CONFOCAL MICROSCOPE
		Leica TCS SPE DM5500 (120 - 520 K) manuals(onsite only) 

        -       DESKTOP SCANNING ELECTRON MMICROSCOPE
		Hitachi TM-3000 (250 - 320 K) manuals(onsite only)              
 
        -       SMALL ANGLE X-RAY SCATTERING (SAXS)
		Rigaku  PSAXS-L (120 - 520 K) with simultaneous WASX measurements              
 
        -       WIDE ANGLE X-RAY DIFFRACTOMETER
		Bruker AXS D8 ADVANCE (120 - 520 K) pdfnotes(onsite only)

	-       DYNAMIC AND STATIC LIGHT SCATTERING (LS)
		3D LS Spectrometer (280 - 360 K) (angular range: 12 - 153 deg)                

OTHER COMPLEMENTARY TECHNIQUES        

        -       REFRACTOMETER
                Metricon 2010/M Prism Coupler

        -       CLIMATIC CHAMBER
                VOTSCH VCL 0003 (290 - 380 K, rh>5%)

        -       VACUUM OVENS
                HERAEUS VT SERIES (290 - 420 K, 0.1 mBar)

        -       FREEZE-DRYING SYSTEM
                COOLVACUUM, LYOMICROM -80

        -       SPUTTERING SYSTEM
                HERAEUS VT 6025 

CHEMISTRY LABORATORY 

        -       ABSOLUTE MOLECULAR MASS DISTRIBUTION DETERMINATION 
                Agilent 1200 GPC-SEC Analysis System +
		Wyatt Ligth-scattering miniDAWN TREOS + 
		Differential viscosimeter ViscoStar II + 
		Refractive Index Detector Optilab rEX 
   
        -       ABSOLUTE MOLECULAR MASS DISTRIBUTION DETERMINATION 
                Nexera 40 GPC system Shimadzu with Refractive Index Detector  +
                Shimadzu UV- Detector +
                Wyatt MultiAngle-Ligth-Scattering miniDAWN NEON 
      
        -       RECYCLING PREPARATIVE GPC 
		LABOACE LC-5060 (Japan Analytical Industry) 
		Equipped with UV & RI DETECTORS
		JAIGEL 2.5 HR, 3 HR AND 4 HR columns and column oven.
 
 	-	NANOPARTICLE SIZE AND Z-POTENCIAL DETERMINATION 
                Malvern Zetasizer Nano 

        -       VISCOSIMETER 
                Malvern SV-10 Vibro Viscometer 

        -       SURFACE TENSION DETERMINATION 
                Contact Angle meter OCA 15 EC DataPhysics Instruments GmbH 

        -       LIQUID/SOLUTION DENSITY METER 
                ANTON PAAR model: DMA 4500 M       
                                                                        
                                                              
      
        -       UV-VIS SPECTROMETER 
                Agilent 8453A with Peltier thermostatted cell holder, T-controller 89090A

        -       CLOSE VESSEL MICROWAVE ASSSISTED REACTOR 
                CEM Discover SP System (200- 550 K, 0-27 bar)

                          

                          

COMPUTING FACILITIES FOR MOLECULAR DYNAMIC SIMULATIONS

        - INSIGHT II (4.0.0.+ version) & Materials Studio Package & Discovery Studio Package from Accelrys. (some results)

 	- HP Server, 16 CPUs, 2 Intel Xeon QC + 2 G5 Intel QC processors (2.13 GHz), 32Gb RAM

 	- BULL cluster. 128 cores Intel Xeon 2.8 GHz, 128 Gb RAM, scratch disk 15 Tb, Red Hat Enterprise Server (some results)

 

TECHNIQUES AVAILABLE AS GENERAL RESEARCH SERVICES AT THE UPV/EHU 

        -       NUCLEAR MAGNETIC RESONANCE

        -       ELECTRON MICROSCOPY 

        -       OTHER CHARACTERIZATION TECHNIQUES 

TECHNIQUES FREQUENTLY USED IN LARGE SCALE FACILITIES 

       -       INELASTIC AND QUASIELASTIC NEUTRON SCATTERING
                ILL, JCNS, ISIS, PSI, ...

       -       SYNCHROTRON RADITATION X-RAY SCATTERING
  
               ESRF, ...