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THE DIELECTRIC SPECTROSCOPY LABORATORY

It is a general purpose facility which is focused and optimized for the study of dynamical processes in polymers,
in particular and other soft-matter in general.
The main features are: i) by combining different spectrometers it covers a huge dynamical range of about 16 orders of
magnitude in the time/frequency scale and ii) a wide range of sample environments can be used.
At present it is one of the facilities forming the European infrastructure for spectroscopy, scattering and
imaging of soft matter EUSMI, which offers free-access and support.  
THERMAL ANALYSIS TECHNIQUES        

- DIFFERENTIAL SCANNING CALORIMETRY (DSC)
Q2000 TMDSC, TA Instruments(100 - 700 K) (some examples)

- FLASH DIFFERENTIAL SCANNING CALORIMETRY (Flasch DSC)
Flash DSC1, Mettler Toledo (180 - 700 K) (heating rates 30 K/min. … 2400000 K/min)

- PVT MEASURING SYSTEM
pvT100, Thermo Haake (200 - 550 K, 200 - 2500 Bar)

- THERMOGRAVIMETRIC ANALYSIS (TGA)
Q500, TA Instruments (290 - 1300 K)

- RESEARCH DILATOMETER (DIL)
Zero Friction L75V, Linseis (100 - 800 K) dual push rod version. manuals(onsite only)

MECHANICAL ANALYSIS TECHNIQUES

- RHEOMETRY
ARES-LS2, TA Instruments (130 - 800 K) (1mHz - 50 Hz)
Simultaneous electric impedance analysis (20Hz - 1MHz)
        -       Miniature Material Tester
Minimat 200 Rheometrics Scientific (200 - 500 K)

- EMS-Viscosimeter
EMS-1000 Kyoto Electronics Manufacturing (0.1-1e5 mPa s) (300 - 473 K)

MOLECULAR SPECTROSCOPIES

- INFRARED SPECTROMETER FT-IR
JASCO 6300 (130 - 400 K) manuals(onsite only)

- RAMAN SPECTROMETER FT-RAMAN
JASCO RFT-6000 (130 - 400 K) manuals(onsite only)

- TERAHERTZ SPECTROMETER
TPS SPECTRA 3000, TeraView

STRUCTURAL CHARACTERIZATION TECHNIQUES        

- ATOMIC FORCE MICROSCOPE
MultiMode V, Veeco (250 - 470 K), working modes: AFM, LFM, EFM, MFM, TUNA

- OPTICAL/CONFOCAL MICROSCOPE
Leica TCS SPE DM5500 (120 - 520 K) manuals(onsite only)

- DESKTOP SCANNING ELECTRON MMICROSCOPE
Hitachi TM-3000 (250 - 320 K) manuals(onsite only)

- SMALL ANGLE X-RAY SCATTERING (SAXS)
Rigaku PSAXS-L (120 - 520 K) with simultaneous WASX measurements

- WIDE ANGLE X-RAY DIFFRACTOMETER
Bruker AXS D8 ADVANCE (120 - 520 K) pdfnotes(onsite only)

- DYNAMIC AND STATIC LIGHT SCATTERING (LS)
3D LS Spectrometer (280 - 360 K) (angular range: 12 - 153 deg)

OTHER COMPLEMENTARY TECHNIQUES        

- REFRACTOMETER
Metricon 2010/M Prism Coupler

- HOT-PLATE HYDRAULIC PRESS
Labopress 200-T VOGT (290 - 550 K)

- CLIMATIC CHAMBER
VOTSCH VCL 0003 (290 - 380 K, rh>5%)

- VACUUM OVENS
HERAEUS VT SERIES (290 - 420 K, 0.1 mBar)

- FREEZE-DRYING SYSTEM
TELSTAR, CRYODOS -80

- SPUTTERING SYSTEM
HERAEUS VT 6025 (290 - 420 K, 0.1 mBar)

CHEMISTRY LABORATORY 
        -       ABSOLUTE MOLECULAR MASS DISTRBUTION DETERMINATION 
Agilent 1200 GPC-SEC Analysis System +
Wyatt Ligth-scattering miniDAWN TREOS +
Differential viscosimeter ViscoStar II +
Refractive Index Detector Optilab rEX

- RECYCLING PREPARATIVE GPC
LABOACE LC-5060 (Japan Analytical Industry)
Equipped with UV & RI DETECTORS
JAIGEL 2.5 HR, 3 HR AND 4 HR columns and column oven.

- NANOPARTICLE SIZE AND Z-POTENCIAL DETERMINATION
Malvern Zetasizer Nano

- VISCOSIMETER
Malvern SV-10 Vibro Viscometer

- SURFACE TENSION DETERMINATION
Contact Angle meter OCA 15 EC DataPhysics Instruments GmbH

- LIQUID/SOLUTION DENSITY METER
ANTON PAAR model: DMA 4500 M
        -       UV-VIS SPECTROMETER 
Agilent 8453A with Peltier thermostatted cell holder, T-controller 89090A

- CLOSE VESSEL MICROWAVE ASSSISTED REACTOR
CEM Discover SP System (200- 550 K, 0-27 bar)

COMPUTING FACILITIES FOR MOLECULAR DYNAMIC SIMULATIONS
        - INSIGHT II (4.0.0.+ version) & Materials Studio Package & Discovery Studio Package from Accelrys. (some results)
- HP Server, 16 CPUs, 2 Intel Xeon QC + 2 G5 Intel QC processors (2.13 GHz), 32Gb RAM
- BULL cluster. 128 cores Intel Xeon 2.8 GHz, 128 Gb RAM, scratch disk 15 Tb, Red Hat Enterprise Server (some results)

TECHNIQUES AVAILABLE AS GENERAL RESEARCH SERVICES AT THE UPV/EHU 

- NUCLEAR MAGNETIC RESONANCE

- ELECTRON MICROSCOPY

- OTHER CHARACTERIZATION TECHNIQUES


TECHNIQUES FREQUENTLY USED IN LARGE SCALE FACILITIES 

- INELASTIC AND QUASIELASTIC NEUTRON SCATTERING
ILL, JCNS, ISIS, PSI, LB, FRM II, ...

- SYNCHROTRON RADITATION X-RAY SCATTERING
ESRF



Contact |Where we are | Group photo | Last updated December 2017